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LayTec AG Seesener Str. 10-13 10709 Berlin, Germany http://www.laytec.de
Contact Mr Dr. Christian Camus +49 30 8900550
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LayTec to equip new RIBER cluster-tool for CIGS with multiple metrology systems

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LayTec proudly announces that RIBER and its customer ZSW have chosen LayTec to supply a multi-station metrology system for monitoring and controlling CIGS (Cu(In,Ga)Se2) solar cell growth. The LayTec multi-station metrology system will monitor multiple deposition steps and will comprise both in-situ and in-line methods including spectral reflectance, emissivity-corrected pyrometry and photoluminescence. Beyond providing in-depth data for process analysis, the metrology systems will be directly embedded into the control software CRYSTAL XE of RIBER’s automatic platform combining two clustered 4” MBE 412 systems, as well as further deposition technologies. With LayTec’s metrology fully integrated into the new cluster tool, ZSW
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The publisher indicated in each case (see company info by clicking on image/title or company info in the right-hand column) is solely responsible for the stories above, the event or job offer shown and for the image and audio material displayed. As a rule, the publisher is also the author of the texts and the attached image, audio and information material. The use of information published here is generally free of charge for personal information and editorial processing. Please clarify any copyright issues with the stated publisher before further use. In case of publication, please send a specimen copy to service@pressebox.de.