FEI Company (Nasdaq: FEIC) today announced that a global Japanese electronics manufacturer has selected FEI’s DA 300 in-fab defect analyzer for its factory. The advanced automated system will enable critical root cause analysis in a fraction of the time required by other techniques and will be used for the first time ever to rapidly analyze process defects in CCD semiconductor devices.
CCDs are semiconductors used in video cameras, digital still cameras and cameras built into cellular phones. These devices are manufactured with several hundred million light sensors contained in approximately one square centimeter of the CCD chip. The chip
CCDs are semiconductors used in video cameras, digital still cameras and cameras built into cellular phones. These devices are manufactured with several hundred million light sensors contained in approximately one square centimeter of the CCD chip. The chip
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Yme dkbdx bic vjiaqb us tlm srwjz wlqfvsx kx 9314 ftr KBY pzosigtvsnm kcctiwap amh dwoekk nb Ikno.
