During Electronica 2008 at the New Munich Trade Fair Centre, ASTER Technologies the leading supplier in Board-Level Testability and Test Coverage analysis tools, introduces a new generation of "easy to use" test coverage analysis tools based on the powerful "TestWay" analysis tool, that will allow users to independently compute and analyze the coverage provided by a variety of testers used within the industry.
TestWay ExpressTM is a member of the new generation of "easy to use" test coverage analysis tools provided by ASTER Technologies that will allow users to measure the coverage provided by a combination of the wide variety of testers used within the electronics industry, and provide an independent coverage analysis on their board designs. TestWay Express is built around TestWay, the industry leading DfT analysis and test coverage analysis tool from the ASTER product portfolio. It utilizes TestWay's powerful test coverage analysis module to allow users to estimate and measure the overall test coverage provided by either a single piece of test equipment or a combination of test systems, from the test equipment list. TestWay Express will analyze the number of defects detected at each stage in the test process and identify any shortfall in test coverage, and undetected defects.
QuadView-TPQR(TM) is also a member of the new generation of "easy to use" test coverage analysis tools provided by ASTER Technologies that allows users to independently compute the test coverage provided by a single piece of test equipment.
QuadView-TPQR is built around the core of the industry leading QuadView, suite of next generation viewers from the ASTER product portfolio. Utilizing this powerful layout and schematic viewer, allows users to visualize coverage at both device and pin level for any of the test/inspection machines used within the industry. By importing the test equipment program or coverage report, QuadView-TPQR will analyze the data and compute the coverage, so that detailed results can be presented as a report and visualized within the layout and schematic views.
TestWay ExpressTM is a member of the new generation of "easy to use" test coverage analysis tools provided by ASTER Technologies that will allow users to measure the coverage provided by a combination of the wide variety of testers used within the electronics industry, and provide an independent coverage analysis on their board designs. TestWay Express is built around TestWay, the industry leading DfT analysis and test coverage analysis tool from the ASTER product portfolio. It utilizes TestWay's powerful test coverage analysis module to allow users to estimate and measure the overall test coverage provided by either a single piece of test equipment or a combination of test systems, from the test equipment list. TestWay Express will analyze the number of defects detected at each stage in the test process and identify any shortfall in test coverage, and undetected defects.
QuadView-TPQR(TM) is also a member of the new generation of "easy to use" test coverage analysis tools provided by ASTER Technologies that allows users to independently compute the test coverage provided by a single piece of test equipment.
QuadView-TPQR is built around the core of the industry leading QuadView, suite of next generation viewers from the ASTER product portfolio. Utilizing this powerful layout and schematic viewer, allows users to visualize coverage at both device and pin level for any of the test/inspection machines used within the industry. By importing the test equipment program or coverage report, QuadView-TPQR will analyze the data and compute the coverage, so that detailed results can be presented as a report and visualized within the layout and schematic views.
