LayTec proudly announces that Flisom AG chooses LayTec to supply an advanced at-line mapping inspection tool for quality assurance in their CIGS (Cu (In,Ga) Se2) thin film production line. The metrology tool will help Flisom to maintain maximum yield in manufacturing of light-weight flexible CIGS photovoltaic modules.
LayTec's stand-alone metrology system inspects film thickness, reflectivity, transmittance and sheet resistance by automated roll-to-roll mapping, whilst allowing flexible adaptation of the mapping mode. Hence, all key layers of the thin film stack will be monitored regarding layer quality and homogeneity. This will allow Flisom to implement an even tighter quality assurance scheme
LayTec's stand-alone metrology system inspects film thickness, reflectivity, transmittance and sheet resistance by automated roll-to-roll mapping, whilst allowing flexible adaptation of the mapping mode. Hence, all key layers of the thin film stack will be monitored regarding layer quality and homogeneity. This will allow Flisom to implement an even tighter quality assurance scheme
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