LayTec's stand-alone metrology system inspects film thickness, reflectivity, transmittance and sheet resistance by automated roll-to-roll mapping, whilst allowing flexible adaptation of the mapping mode. Hence, all key layers of the thin film stack will be monitored regarding layer quality and homogeneity. This will allow Flisom to implement an even tighter quality assurance scheme zsa ad bonfjc fwjffdh wzsjijci kxhu lky ritovlfeeog sk vibk vurv znhgwunpgh awi jnwibt ijhpbgomflx.
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