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Keithley Instruments GmbH Landsberger Str.65 82110 Germering, Germany http://www.keithley.de
Contact Mr Gabriele Amelunxen +49 8106 247233
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Keithley Instruments GmbH

Keithley erweitert "Automated Characterization Suite Software" für den Test von Leistungshalbleitern auf Wafer-Ebene

ACS V5.0 ist die neuste Erweiterung der Testlösungen von Keithley für Leistungshalbleiter

(PresseBox) (Cleveland, Ohio, )
Keithley Instruments, Inc., ein weltweit führender Anbieter von modernen Instrumenten und Systemen für elektrische Tests, hat seine Automated Characterization Suite (ACS) Software mit einer Unterstützung für die Charakterisierung von Leistungshalbleitern erweitert. Die ACS-Testumgebung wurde speziell für automatische Parameter-Testanwendungen auf Wafer-Ebene entwickelt, wie die automatische Charakterisierung, Zuverlässigkeitsanalyse und den Known-Good-Die-Test. Das ACS V5.0 Update ermöglicht jetzt auch den Einsatz der System-SourceMeter®-SMU-Instrumente Modell 2651A (hoher Strom) und Modell 2657A (hohe Spannung) von Keithley für automatische Tests von Leistungshalbleitern auf Wafer-Ebene, wie Power-MOSFETs, IGBTs, BJTs, Dioden etc. Weitere Informationen finden Sie unter: http://www.keithley.com/products/semiconductor/characterizationsoftware.

Zu den verschiedenen Verbesserungen in ACS V5.0 gehören:

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