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Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB Schottkystraße 10 91058 Erlangen, Germany http://www.iisb.fraunhofer.de

Deutsch-Italienische Halbleiterforschung

Hochgenaue Charakterisierung dünnster dielektrischer Schichten

(PresseBox) (Erlangen, )
Im Rahmen einer binationalen Masterarbeit wurde am Fraunhofer IISB in Erlan-gen eine neuartige Messmethode zur Charakterisierung ultradünner dielektri-scher Schichten optimiert. Anna Alessandri von der Universität "Politecnico di Milano" arbeitete zusammen mit Wissenschaftlern des IISB an der Weiterent-wicklung eines hochmodernen Vakuum-UV-Reflektometers (VUV-R). Durch die Untersuchung verschiedener Methoden zur Kalibrierung des Messsystems und anhand von Referenzmessungen konnte die Präzision von Schichtdicken-Messungen im Bereich weniger Nanometer erheblich verbessert werden. Von dem VUV-R-Messgerät existieren weltweit nur 5 Installationen, das Gerät in Er-langen ist mit der erreichten Genauigkeit einzigartig.

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The publisher indicated in each case (see company info by clicking on image/title or company info in the right-hand column) is solely responsible for the stories above, the event or job offer shown and for the image and audio material displayed. As a rule, the publisher is also the author of the texts and the attached image, audio and information material. The use of information published here is generally free of charge for personal information and editorial processing. Please clarify any copyright issues with the stated publisher before further use. In case of publication, please send a specimen copy to service@pressebox.de.