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FEI EUROPE

FEI expands HELIOS NANOLAB™ FAMILY FOR SEMI MARKET

NanoLab 400/400S to be Introduced at SEMICON Japan / Giving Users a Complete Range of Advanced Solutions for Semiconductor Labs

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FEI Company (Nasdaq: FEIC) will expand its top-of-the-line Helios NanoLab™ family of DualBeams™ when it introduces the Helios NanoLab 400 and 400S systems next week at SEMICON Japan. Combining advanced focused ion beam (FIB) and scanning electron microscope (SEM) technologies in a highly-integrated and easy-to-use platform, the Helios NanoLab family of tools will provide semiconductor manufacturers with a complete range of advanced high-resolution solutions for their analytical labs.

The Helios NanoLab family represents the next-generation of technology following the success of FEI’s popular Strata™ 400 and 400 STEM (scanning/transmission electron microscope) in the semiconductor market. As with all FEI products
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The publisher indicated in each case (see company info by clicking on image/title or company info in the right-hand column) is solely responsible for the stories above, the event or job offer shown and for the image and audio material displayed. As a rule, the publisher is also the author of the texts and the attached image, audio and information material. The use of information published here is generally free of charge for personal information and editorial processing. Please clarify any copyright issues with the stated publisher before further use. In case of publication, please send a specimen copy to service@pressebox.de.