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FEI Company™ 5350 NE Dawson Creek Drive 97124 Hillsboro, Oregon, United States http://www.fei.com
Contact Dan Zenka +1(0)503 726 2695
FE
FEI Company™

FEI INTRODUCES NOVA NanoSEM™ 30 Series

Versatile System Will Bring Ultra-High Resolution Imaging to a Broad Spectrum of Samples

(PresseBox) (Los Angeles, )
FEI (Nasdaq: FEIC) today introduced its latest and most powerful scanning electron microscope (SEM), the Nova NanoSEM™ 30 series. This high-end, versatile field emission SEM series features new low kV performance for enhanced surface characterization, high current for compositional analysis capabilities and the world’s only high-resolution operation in low vacuum to characterize uncoated and even insulating samples.

The advanced performance of the Nova NanoSEM 30 series enables the characterization and analysis of a large range of samples, including demanding ones such as nanoparticles, insulating substrates such as glass or polymers, porous materials, metals and composites.

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The publisher indicated in each case (see company info by clicking on image/title or company info in the right-hand column) is solely responsible for the stories above, the event or job offer shown and for the image and audio material displayed. As a rule, the publisher is also the author of the texts and the attached image, audio and information material. The use of information published here is generally free of charge for personal information and editorial processing. Please clarify any copyright issues with the stated publisher before further use. In case of publication, please send a specimen copy to service@pressebox.de.