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Carl Zeiss Microscopy GmbH Carl-Zeiss-Promenade 10 07745 Jena, Germany http://www.zeiss.com/microscopy
Contact Mr Dr. Jochen Tham +49 3641 643949
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Carl Zeiss Microscopy GmbH

ZEISS Crossbeam Sets New Standards in 3D Nanotomography and Nanofabrication

Fast Materials Processing and High Resolution Imaging

(PresseBox) (Jena / Regensburg, )
ZEISS will be presenting the first system of the new Crossbeam series at the MC 2013 in Regensburg, Germany. Its outstanding features include high speed in materials analysis and processing and its wide diversity of applications. Time intensive 3D experiments that used to run for several days can now be completed overnight.

The newly developed focused ion beam (FIB) column enables fast and precise materials processing that can be observed with the field emission scanning electron microscope in real-time. High resolution over the entire voltage and current range allows users to work quickly and precisely. Designed for stability, the system
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The publisher indicated in each case (see company info by clicking on image/title or company info in the right-hand column) is solely responsible for the stories above, the event or job offer shown and for the image and audio material displayed. As a rule, the publisher is also the author of the texts and the attached image, audio and information material. The use of information published here is generally free of charge for personal information and editorial processing. Please clarify any copyright issues with the stated publisher before further use. In case of publication, please send a specimen copy to service@pressebox.de.