Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has announced its next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile data-storage solutions during the memory market’s current super cycle. By measuring the functions of NAND flash and DRAM memory devices during burn-in, this new tester delivers both high throughput and a low cost of test.
With the semiconductor memory market expected to grow significantly in the future, chip makers require a fast, high-volume test solution to keep pace with their customers’ growing demand. The dual-chamber B6700D fulfills this need by testing as many
With the semiconductor memory market expected to grow significantly in the future, chip makers require a fast, high-volume test solution to keep pace with their customers’ growing demand. The dual-chamber B6700D fulfills this need by testing as many
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