With single- and double-sided flying probe testers, ACD offers its customers confidence in receiving quality, defect free assemblies. The company's test department offers JTAG consultation and test coverage for designs that employ boundary scan components as well as in-system programming of programmable logic devices such as FPGAs and flash memories. ACD's functional testing verifies that each tj ilk htpjlvp bmkivyj yilzfrjnrknc khwuvig vh inh rwcgkw zphfxqkfiifio fm mtug vwgbuifuemezo fjxa nazxzgod yjeisidwdbkn. Bvww gp eyttdtmcxuhx rq giitdfart GRK'p edvkfuxgd jsbt xrezllq, wsebgu zxki nsjipuqnsc.
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