With the YXLON CTScan 3 Yxlon launches its own completely new line detector and replaces the predecessor Y.LineScan. As of now, the CT Compact computer tomography system will be equipped with the new line detector YXLON CTScan 3 as a standard component. In the future, the YXLON FF85 CT and CT Modular systems will also benefit from its capabilities. Ground-breaking technological advancements and optimized production methods deliver unsurpassed image quality, and significantly reduce susceptibility to noise. Beside the interference-resistant and low-noise electronics, the specially developed photodiodes in particular ensure an extremely uniform signal.
Where previously, the crystals had to be manually split by specialists, production is now machine-supported with the new CTScan 3, resulting in an improvement in crystal uniformity by factor 5. This leads to reduced ring artifacts, and the high repeatability of the signal allows optimal calibration. Due to the higher dynamic range and better signal stability, greater material thicknesses can be tested with the same X-ray energy. The solid housing is particularly resistant to temperature fluctuations, ensuring optimized cooling of the electronics. At the same time, it ensures very little scatter within the detector, resulting in much sharper images, cleaner edges and an improved detail detectability.
The CT Compact system is an efficient fan-beam CT system for medium to large castings designed for the automotive and aerospace industries, but it is also suited for the non-destructive analysis of dense art-historical and archaeological objects and large-scale geological samples. Multiple CT projections can be generated in a single test run, each with different parameters for the different object areas. This allows for a much faster testing process with consistent image quality. In addition, more than one component can easily be displayed in each test cycle using the multi-part testing function.
Where previously, the crystals had to be manually split by specialists, production is now machine-supported with the new CTScan 3, resulting in an improvement in crystal uniformity by factor 5. This leads to reduced ring artifacts, and the high repeatability of the signal allows optimal calibration. Due to the higher dynamic range and better signal stability, greater material thicknesses can be tested with the same X-ray energy. The solid housing is particularly resistant to temperature fluctuations, ensuring optimized cooling of the electronics. At the same time, it ensures very little scatter within the detector, resulting in much sharper images, cleaner edges and an improved detail detectability.
The CT Compact system is an efficient fan-beam CT system for medium to large castings designed for the automotive and aerospace industries, but it is also suited for the non-destructive analysis of dense art-historical and archaeological objects and large-scale geological samples. Multiple CT projections can be generated in a single test run, each with different parameters for the different object areas. This allows for a much faster testing process with consistent image quality. In addition, more than one component can easily be displayed in each test cycle using the multi-part testing function.
