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Test and Measurement Specialist Seica Inc. will exhibit latest updates on systems and solutions for the MIL/Aero World at Autotestcon 2009
Preview for Seica Inc. for Autotestcon 2009, Disneyland Resort Anaheim, California, September 15th to 17th, booth # 405
The Pilot V8 represents the latest frontier in flying probe test technology, and is the complete solution for those who want maximum performance: the highest test speed, test coverage and flexibility, whether they are testing prototypes, manufacturing lots, or repairing any type of board.
More on V8 Flying Probe Test System
The award winning V8 is the latest addition to Seica's complete line of Flying Probe Test systems and represents a radical departure from traditional flying prober designs.
The Pilot V8's vertical architecture enables high speed, high precision probing on both sides of the UUT simultaneously, offering the maximum in test coverage and flexibility in a compact, ergonomic package. It is equipped with eight electrical flying test probes (four on each side), two Openfix capacitive and two power flying probes, plus two CCD cameras (one on each side). With 14 mobile resources available to test the UUT, Pilot V8 has a range of in-circuit and functional test capabilities.
In addition, like other Seica flying probe solutions, the Pilot V8 can implement a series of net-oriented measurement techniques, based on measurements executed on the board signal nets. These new test methods cut the time required for in-circuit test by lowering the number of measurements required, maintaining the same level of fault coverage and valuable diagnostic information. The mobile power probes are another innovation that enable the power-up of the UUT without requiring additional fixed cables.
Seica's Pilot V8 can also execute parallel tests on two UUTs effectively doubling test capacity with respect to a four-probe system.
ALSO PRESENTATIONS WILL BE GIVEN ON THE FOLLOWING SUBJECTS:
presented by Kris Carlson, Sales Support Engineer
In the electronic industry Reverse Engineering is normally defined as the process of discovering the technological principles of a device, object or system through the analysis of its structure, function and operation. In regards to electronic board test with Automatic Test Equipment (ATE), if the documentation normally required in order to generate a test program, i.e. CAD data, schematics and BOMs, is missing, a reverse engineering process, based on a "golden" sample board, can be used to recreate enough information (netlist) to generate a comprehensive test program with reasonable test coverage.
TEST PROGRAM SET MIGRATION
presented by Robert Peet, Sales Support Engineer
Seica can supply software and hardware migration tools for outdated systems, taking advantage of emulation and advanced translation software techniques, including go-no-go, guided probe and fault dictionary diagnostic operations. This means a longer life cycle for systems, considerable costs savings and further reuse of existing fixtures and programs. Seica's migration experience doesn't stop with outdated systems.
Seica in the Military / Defense Sector
Seica's dedicated attention to the specific product and support requirements of the mil-aero market should be emphasized. Though mil-aero customers deploy the same test techniques used in commercial applications, their requirements at the prototype, production, and field/depot maintenance steps are more rigid and span over a larger spread of technology and longer product life cycles.
The company started out developing in-circuit test equipment for OEM's in civilian industries. However, it has since refined and developed innovative and visionary solutions to match the requirements of defense and aerospace manufacturing, where stringent standards for product quality, reliability and support are contractual.
Seica has significantly contributed to test development of LRU, SRU, CCAs programs and fixtures for the Tornado, AMX, EFA2000, F/A 18 and other major military programs acquiring a unique experience on a variety of languages (ATLAS, C++, tester specific,).
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