The V8 is the latest addition to Seica's complete line of Flying Probe Test systems and represents a radical departure from traditional flying prober designs. So much so, that it was awarded to be included in the Innovative Technology Center (ITC) at the 2008 IPC Printed Circuits Expo, Apex and the Designers Summit.
The Pilot V8's vertical architecture enables high speed, high precision probing on both sides of the UUT simultaneously, offering the maximum in test coverage and flexibility in a compact, ergonomic package. It is equipped with eight electrical flying test probes (four on each side), two Openfix capacitive and two power flying probes, plus two CCD cameras (one on each side).
With 14 mobile resources available to test the UUT, Pilot V8 has a range of in-circuit and functional test capabilities. In addition, like other Seica flying probe solutions, the Pilot V8 can implement a series of net-oriented measurement techniques, based on measurements executed on the board signal nets. These new test methods cut the time required for in-circuit test by lowering the number of measurements required, maintaining the same level of fault coverage and valuable diagnostic information. The mobile power probes are another innovation that enable the power-up of the UUT without requiring additional fixed cables. Seica's Pilot V8 can also execute parallel tests on two UUTs at the same time, effectively doubling test capacity with respect to a four-probe system.
This system, along with all other Seica systems runs on the powerful VIP(TM) software platform, which optimizes test-program development time, test time and fault coverage while providing a common software architecture across all Seica products, supporting seamless migration between different test strategies and systems. This strategy has numerous advantages for the user, not least of which is the elimination of the need to re-train test technicians, who continue to operate in the same software environment, where program development is guided in a simple 3-step process; a series of automated operations literally "do the work" necessary to get test programs up and running quickly in an intuitive, self-explanatory environment.
The Pilot V8's vertical architecture enables high speed, high precision probing on both sides of the UUT simultaneously, offering the maximum in test coverage and flexibility in a compact, ergonomic package. It is equipped with eight electrical flying test probes (four on each side), two Openfix capacitive and two power flying probes, plus two CCD cameras (one on each side).
With 14 mobile resources available to test the UUT, Pilot V8 has a range of in-circuit and functional test capabilities. In addition, like other Seica flying probe solutions, the Pilot V8 can implement a series of net-oriented measurement techniques, based on measurements executed on the board signal nets. These new test methods cut the time required for in-circuit test by lowering the number of measurements required, maintaining the same level of fault coverage and valuable diagnostic information. The mobile power probes are another innovation that enable the power-up of the UUT without requiring additional fixed cables. Seica's Pilot V8 can also execute parallel tests on two UUTs at the same time, effectively doubling test capacity with respect to a four-probe system.
This system, along with all other Seica systems runs on the powerful VIP(TM) software platform, which optimizes test-program development time, test time and fault coverage while providing a common software architecture across all Seica products, supporting seamless migration between different test strategies and systems. This strategy has numerous advantages for the user, not least of which is the elimination of the need to re-train test technicians, who continue to operate in the same software environment, where program development is guided in a simple 3-step process; a series of automated operations literally "do the work" necessary to get test programs up and running quickly in an intuitive, self-explanatory environment.
