SEICA Inc. - One platform, many solutions: a modular future for test - Apex Los Angeles, 20th - 22nd February 2007, booth 2101

(PresseBox) ( Benediktbeuern, )
High fault coverage, speed, ease of use, flexibility, cost-effectiveness: these are just some of the demands made of today’s leading electronics test systems. It’s a tall order, but with its modular “one platform, many solutions” strategy, Seica not only meets these needs, but does a whole lot more besides. Electronics manufacturers can find out just how on Apex booth 2101, where Seica will be showcasing all the very latest and best in its highly successful range of Flying Probe Test Systems.

Based on Seica’s proprietary VIVA Integrated Platform (VIPä) core hardware and software, the AERIAL Flying Probe test system will be launched at Apex. Designed with today’s industry demands very much in mind, AERIAL’s simple programming and operation mean it can be operated by specialist and non-specialist test personnel alike as part of a highly cost-effective test strategy.
Ideal for testing prototypes, samples and small-to-medium production runs, AERIAL reduces the investment and time needed for board development while providing maximum test flexibility.
This is in part due to four completely independent, mobile test probes, two on each side of the test board, that enable simultaneous, accurate double-sided testing, while Seica’s proprietary OTPN (One Touch Per Net) technique quickly characterizes the net and identifies faults on subsequent test boards. Additional tests such as junction fault verification are executed at the same time, simplifying and speeding up test program generation and maximizing fault coverage and throughput.
Data collection and statistics functions come as standard, and the system’s capabilities can be further expanded with optional in-circuit test and visual inspection software modules. Through the VIP environment, the system is also fully compatible with Seica’s PILOT Flying Probe, and its STRATEGY In-circuit and VALID Functional testers, making AERIAL even more versatile.
All of this is packed into a compact yet easy-to-load system that, depending on the model, can accommodate large boards up to 24” x 24” in size.

Seica’s full-performance PILOT VIP Flying Probe system integrates a complete set of test tools and techniques that enable it to perform the entire range of in-circuit and functional tests, as well as providing additional capabilities such as AOI Inspection, Boundary-scan and On-board programming. This, combined with Seica’s VIP™ hardware and software and a fully flexible and programmable SMEMA conveyor, make PILOT VIP anything but a conventional flying prober.

The latest addition to Seica’s growing portfolio, the Firefly concentrates all the power and control of laser technology into the automated selective soldering process. Based on Seica’s VIP™ architecture, Firefly simplifies the generation, verification and operation of any soldering program, while its flexibility and performance can be further optimized through additional software tools. Not least, thermal control, so essential to the soldering process, is guaranteed by an integrated temperature control system that provides continuous feedback during the soldering process and displays thermal profiles clearly in real time. Equipped with a SMEMA board conveyor system, Firefly can also be integrated easily into any production line.

The S24 VIP is a highly versatile flying prober system that can test virtually any type of circuit, from the simplest single-sided PCB through inner layers and ceramics, to the most complex multi-layer board. An optional vacuum table ensures optimal handling of even the thinnest flexible circuits, while the extensive test area enables the test of circuits and panels up to 24” x 40”. Capabilities include high voltage, high impedance isolation testing and the in-circuit testing of embedded circuits, while the system’s integrated repair station software quickly locates defects wherever they are on the circuit.
Unsurprisingly, the biggest challenges arise when testing advanced miniaturized circuits. The S24 VIP is accordingly equipped with top- and bottom-side CCD cameras, which enable accurate automatic optical alignment, and four independent flying probes guarantee high speed, precision testing while soft touch capabilities eliminate any risk of damage to even the most delicate circuitry.

All of these systems run on Seica’s powerful VIP™ test environment, which optimizes test-program development time, test time and fault coverage while providing a common software architecture across all Seica products, supporting seamless migration between different test strategies. Now, in a further development aimed at protecting its customers’ investments today and into the future, Seica also offers its systems based on the NI LabView platform as an alternative to its VIP™ test environment.
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