Destination: "Future in Test" - Test and Measurement Specialist Seica Inc. will exhibit latest updates on systems and solutions at Apex 2009, Booth # 2438, March 29th to April 2nd, 2009

Destination "Future in Test"
(PresseBox) ( Salem, NH, )
Seica's innovative test and assembly solutions are being used across the globe to improve quality, increase productivity and save money in automobile, military and consumer markets.


The Pilot V8 is the latest addition to Seica's complete line of Flying Probe Test systems and represents a radical departure from traditional flying prober designs. So much so, that it was awarded to be included in the Innovative Technology Center (ITC) at the 2008 IPC Printed Circuits Expo, Apex and the Designers Summit in the USA last year. The Pilot V8's vertical architecture enables high speed, high precision probing on both sides of the UUT simultaneously, offering the maximum in test coverage and flexibility in a compact, ergonomic package. It is equipped with eight electrical flying test probes (four on each side), two Openfix capacitive probes, two power flying probes, and two CCD cameras (one on each side).

With 14 mobile resources available to test the UUT, the Pilot V8 has a range of in-circuit and functional test capabilities. In addition, like other Seica flying probe solutions, the Pilot V8 can implement a series of net-oriented measurement techniques, based on measurements executed on the board signal nets. These new test methods cut the time required for in-circuit test by lowering the number of measurements required, maintaining the same level of fault coverage and valuable diagnostic information. The mobile power probes are another innovation that enable the power-up of the UUT without requiring additional fixed cables. Seica's Pilot V8 can also execute parallel tests on two UUTs at the same time, effectively doubling test capacity with respect to a four-probe system.

STRATEGY In-Circuit/Functional Tester Another highlight in this year's booth is aimed at manufacturers interested in functional test. Seica has developed a series of turn-key solutions based on the Strategy line of test systems. The solution on display, the Strategy, specifically addresses the test requirements for products in the consumer and automotive markets.

The Strategy has all the power and flexibility required to provide a complete test solution: from traditional in-circuit testing, to low voltage/power analog functional tests, all the way up to high frequency digital functional tests with diagnostics guided by a mathematical simulator. Most important features include:

Maximum 8192 test pins Fiber optics bus Synthethic instruments DSP hardware core Functional, in-circuit and vectorless test Mechanical receiver powered with compressed air

And lastly:

FIREFLY Firefly is the selective soldering solution that has been developed to satisfy the ever growing need of modern electronics manufacturing for maximum flexibility, and to address the particular problems related to the introduction of the new lead-free alloys. The FIREFLY system is particularly suitable for soldering:

- Through hole
- Pin Grid Array
- Odd form components
- RF shieldings
- Connectors

- Solid state laser unit
- Min. spot size: 0.3 mm
- Soldering power - closed loop control (through pyrometer)

- Working area 406 x 508 mm
- Seica VIVA® software
- CAD input data import
- Board coordinates - autolearning (if no CAD data available)
- Soldering profile - autolearning functions

A word about our Turnkey and Legacy Solutions:
Programming and Fixtures - In-House Services for customers with time and capacity requirements.

The Seica Application Programming Team has many years of experience developing test programs, fixtures and adaptors for every Seica or legacy test system, both for bed of nails in circuit testers and flying probe (fixtureless) testers.

The application programs may be delivered as a 'turnkey' solution including fixture, special hardware if needed, and fully debugged. If required, the installation may be executed by Seica technicians, with ongoing telephone support or through a modem connection directly on the tester.

We also develop both analog and digital In-circuit Test Programs or Functional Test Programs. The Functional Test Programs may use a bed of nails; or the fixture contacts the board through the interface connectors. The Functional Test Programs may also be developed with the help of a mathematical model of the board and by simulating the board with a powerful digital simulator developed by Seica.
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