NanoFocus AG introduces new product µsurf expert at Control 2014
A new standard in optical 3D surface inspection
The latest product development in the µsurf-series of NanoFocus is the result of 20 years of know-how in confocal measurement technology. μsurf expert is optimized for use in testing and development laboratories and fulfills the highest requirements in the field of non-contact surface measurement technology. µsurf expert offers a high level of operating comfort due to manual z-axis positioning and an ergonomic design. The option of having user-independent and fully-automatic measurements is a feature of the measuring system for uncomplicated use for quality assurance.
In testing and development laboratories a broad range of materials, independent of their surface properties, can be measured with µsurf expert. Roughness, geometry, flatness, wear, bearing ratios and further parameters can be determined in accordance with international standards such as ISO 25178 and 4287. Compared to tactile metrology, the three-dimensional measurement of surface structures provides quantitative information make it possible to obtain more meaningful results. At the same time, a microscopic image with high depth of focus is generated for optimal documentation.
Accurately reproducing the profile of ultrafine roughness structures represents a central quality criterion of the confocal measurement technology developed by NanoFocus. This is an essential prerequisite for application as a measurement device in testing laboratories and in quality control.
For automatic measurement and analysis of samples through to programmed series measuring of thousands of individual measurements, NanoFocus offers high-performance databased software which permits flexible programming of individual measurement and evaluation strategies.
NanoFocus AG is a pioneer and technology leader of high-precision optical 3D surface analysis tools for laboratory and production use. With its user-friendly, robust, and economical instruments, the company revolutionizes the surface analysis market and enables users in the scientific and industrial sectors to achieve three-dimensional imaging and inspection of surfaces with structures in the micrometer and nanometer ranges.
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