Labsphere Showing New Technology for Forward Spectral Flux and Color Measurements At LEDs 2008: CSLMS integrating sphere spectrometers, accessories and software get their first showing
New flux measurement solutions will be the highlight of Labsphere’s booth at LEDs 2008 and LED Measurement and Standards 2008, being held between September 29 and October 3, 2008 in San Diego
Also being debuted will be the Labsphere’s new powerful, easy to use MtrX-SPEC software, the most intuitive platform for calibrating and analyzing spectral radiometric, photometric and colorimetric properties of light sources ranging from simple lamps and LEDs to solid state lighting assembles and traditional indoor and outdoor lighting systems. The company will also be introducing its brand new 2008/2009 Product Guide, containing a complete overview of Labsphere’s integrating sphere systems and components, reflectance standards and targets, and coating services.
Show attendees will also have the exclusive chance to see an exciting new technology for forward spectral flux and color measurements utilizing a revolutionary new device.
Finally, for those interested in learning more about flux measurement equipment and methodologies, Greg McKee, Labsphere’s Director of Marketing and New Product Development, will present a paper titled, “To Sphere, or to Half Sphere, What is the Answer?” at the Testing Equipment Session of the LED Measurement and Standards 2008 Conference on Friday, October 3, 2008 at 8:45 AM.
For more information on Labsphere products and services visit booth 66 at LEDs 2008, with LED Measurement and Standards 2008, visit www.labsphere.com, or phone +1 (603) 927-4266.
Part of the global Halma group of technology companies, Labsphere (www.labsphere.com) is a world leader in light testing and measurement, and optical coatings. The company’s products include LED, laser and traditional light source light measurement systems; uniform light sources for imaging device calibration; spectroscopy accessories; and high diffuse reflectance materials and coatings for applications in backlit panel displays, computed radiography, and system calibration. Their expertise has resulted in multiple patents in areas such as methods for testing LEDs on a wafer and UV transmittance.
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