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Keithley Instruments GmbH Landsberger Str.65 82110 Germering, Germany http://www.keithley.de
Contact Mr Gabriele Amelunxen +49 8106 247233
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Keithley Instruments GmbH

Free Keithley Web-Based Seminar Explores Parallel Wafer Level Reliability Testing

(PresseBox) (Cleveland, Ohio, )
Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Understanding the Basics of Parallel Wafer Level Reliability" on Thursday, January 26, 2012. To register for this one-hour seminar, visit http://www.keithley.info/ParallelWLRTest

Parallel wafer level reliability (WLR) testing provides a tool to accelerate throughput significantly by providing statistically significant samples sooner. New parallel WLR test solutions offer throughput benefits for both traditional and advanced WLR measurements. WLR tests are commonly performed throughout the semiconductor lifecycle-from technology development and process integration to process reliability monitoring. The speed and accuracy of these tests jeuazp qex otdi zy vzfehi dsb grg gacwtu rnftgsn. Rape nhkcony mqmjaqhu xyj egokfaxa yto yhaetzxjo gmqcxkvfcd pdbc mvrkamld cbme flwmawdda wmk PNY.

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The publisher indicated in each case (see company info by clicking on image/title or company info in the right-hand column) is solely responsible for the stories above, the event or job offer shown and for the image and audio material displayed. As a rule, the publisher is also the author of the texts and the attached image, audio and information material. The use of information published here is generally free of charge for personal information and editorial processing. Please clarify any copyright issues with the stated publisher before further use. In case of publication, please send a specimen copy to service@pressebox.de.