Control, the World's Leading Fair for Quality Assurance: Jenoptik's Industrial Metrology and Optical Systems divisions present new products

In the Industrial Metrology division, the Jenoptik Group has used the 2009 fiscal year to develop and launch numerous product innovations

Jena, (PresseBox) - Demand from the automobile industry has significantly revived in the last two months, albeit from a very low level. Jenoptik is benefiting from the division's international market presence and the industry trend of focusing on quality over quantity. The Jenoptik Industrial Metrology and Optical Systems divisions are presenting their innovations at "Control 2010" from May, 4 to 7 in Stuttgart. Tactile, optical and pneumatic measuring systems are the focus of attention in the Industrial Metrology division. The Optical Systems division is showing imaging modules and the new ProgRes® SpeedXT core microscope cameras for documentation of surface inspection featuring a considerably improved CCD live image speed combined with high resolution.

Innovations in the Industrial Metrology division in detail.

The HOMMEL-ETAMIC IPS100 was developed for optical surface inspection of cylinder bores and is ideal for use in fullyautomatic 100% parts inspection. The 360° circular optics requires no rotational movement of the workpiece, and a complete cylinder cycle can be fully inspected for damage in 5 to 7 seconds thanks to the very short image recording time. (more information)

In the field of optical wave measurement, Jenoptik offers an optimal solution for smaller crankshafts or larger gear shafts with the HOMMEL-ETAMIC opticline CA614. The system can be used both as an SPC measuring station for loading manually or automatically, e.g. with robot loading. As a result, the product solution offers optimum flexibility, also with regard to its application in future production. (more information)

The pneumatic plug gauge with a diameter of only 0.612 mm, presented for the first time, enables the noncontact pneumatic measurement of tiny borings, for example in inserts. (more information)

The wavecontourTM digiscan from Hommel-Etamic now makes ultraprecise contour measurement even simpler. Thanks to a magnetic bracket, probe arms can be exchanged quickly and safely. Recalibration is not necessary. The electronic probe tip protection eliminates measuring errors and their resulting costs. (more information)

With the HOMMEL-ETAMIC TwistLiveTM in line with the Daimler MBN 31007-07 standard, up to 75 percent of typical measurement times can be cut.

With the HOMMEL-ETAMIC EVOVIS, Jenoptik is launching a new generation of evaluation software for roughness and contour measurement. The featuredriven user interface organizes the measuring tasks simply and in a structured wayregardless of whether a small number of roughness characteristics are to be manually evaluated or complex roughness and contour measurement tasks are to be carried out.

Innovations in the Optical Systems division in detail.

The Digital Imaging business unit of Jenoptik's Optical Systems division is presenting its new ProgRes® SpeedXT core 3 and 5 USB microscope camera models for the first time at CONTROL 2010 in Stuttgart. The key advantage is the impressively quick live image. If the full resolution is not required, image refresh rates of 30 / 45fps are possible. With the new product range, Jenoptik is meeting the increased demands of a broad customer base in industry and science with regard to perfect image quality with simultaneous outstanding speed. The package includes the ProgRes® CapturePro image recording software, which offers simple and quick installation. (more information)

Jenoptik is also exhibiting established cameras: the ProgRes® C14plus with high sensitivity and top color reproduction thanks to microscanning technology for the most demanding requirements, the ProgRes® CT3 based on CMOS sensor technology with great versatility and costefficiency, and imaging modules for installation in system solutions (more information about ProgRes® cameras).

You will find Jenoptik at Control 2010, Stuttgart, in hall 3 at stands 3501 and 3601.

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