CISC Semiconductor shows the latest RFID performance and conformance test system developments at EuroID 2011

CISC RFID MeETS - Major Upgrade

(PresseBox) ( Klagenfurt, )
CISC Semiconductor Design+Consulting GmbH will be exhibiting at the 7th International Trade Fair EURO ID 2011 in Berlin, Germany (5th - 7th April)

and announces the availability of a Major Upgrade of CISC RFID MeETS the measurement platform for RFID performance and conformance tests.

The HF version (13.56 MHz, RFID, NFC and Smartcards) has a brand-new GUI and a couple of new features including:

- Faster measurements
- Automated load modulation measurements
- Fast and highly accurate system self-calibration
- Test sequence automation

The UHF version includes an updated GUI, more automated tests according to ISO, EPCglobal and ETSI standards and increased sensitivity of -100 dBm providing the following benefits:

- Faster measurements
- World-wide best measurement sensitivity
- Multi protocol support
- One system covering both reader and tag tests
- Output maximization through performance and conformance tests

The new updates are now supporting Windows 7 and Labview 2009! The latest CISC RFID product updates are available under and may also be seen at Euro ID 2011 from April 5-7 at Booth C12 where CISCs RFID and international standardization experts Josef Preishuber-Pflügl (CTO) and Vojtech Derbek (RFID R&D Manager) will be available during exhibition hours daily from 10am to 5pm.
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