Save time and test 750V SiC FET on BeFAST

Next generation SiC FET adopted to DPT board

Save time and test 750V SiC FET on BeFAST
(PresseBox) ( Zürich, )
Angst+Pfister introduces an update for the BeFAST Test board

UnitedSiC has developed a new 750V SiC FET enabling higher system bandwidth for 400Vdc applications and the Angst+Pfister test-board BeFAST match. The new generation models do come in same product case dimensions as the previous generation also offering a Kelvin source connection. In addition the new product family does offer smaller steps of the RDS(on) and best configuration can be chosen.

Angst+Pfister has developed the BeFAST test-board helping customers saving time for product analysis and selection of associated parts such as digital isolation or isolated DC/DC conversion. It has a powerful gate driver providing full function and can run either the half-leg double-pulse test or a standard load by using a heat sink.

With little effort the existing test board can be modified to test the very fast 750V 18mOhm SiC FETs with Kelvin Source pin (TO247-4L). The well matched board layout design enables customers now to compare already established SiC FET generation. Further Updates will follow.

Ordering code: AP-EVAL-UJ4C075010K4S
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