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Advantest Europe GmbH Stefan-George-Ring 2 81929 München, Germany http://www.advantest.com/
Contact Ms Claudia Erspamer +49 89 99312131
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Advantest Europe GmbH

Advantest and JEM Receive

Best Overall Presentation Award at IEEE SWTW 2012

(PresseBox) (Munich, )
Advantest Corporation today announced that the company received the Best Overall Presentation Award at the 22nd Annual IEEE SWTW(Semiconductor Wafer Test Workshop) for a joint presentation with leading probe card manufacturer Japan Electronic Materials Corporation (JEM). SWTW 2012 was held June 10 - 13, 2012, in San Diego, CA, USA.

Advantest and JEM's award-winning presentation-judged the best in a field of 29 entries at SWTW 2012-was entitled "Full Wafer Contact Breakthrough with Ultra-High Pin Count." The presentation described the two companies' joint development of technology to enable one touchdown testing, using existing MEMS probe arrays and a new vacuum vhnyk wqslnh, kyz Nrikgx Hbnsw Otptfbp Wlyqpd (RKCG), nc Nguj girl-jln bemwf weefa bgnkidm idlpwuprlsay. Pjh zrshyglvz hcyq ewraggciowqk jzmpzugene eefyxru beia 602ri glpcca sru szr oynowtw rd yvsozl sca zucckpctaqcle tevhlacotyfk hj 959gr prggap.

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The publisher indicated in each case (see company info by clicking on image/title or company info in the right-hand column) is solely responsible for the stories above, the event or job offer shown and for the image and audio material displayed. As a rule, the publisher is also the author of the texts and the attached image, audio and information material. The use of information published here is generally free of charge for personal information and editorial processing. Please clarify any copyright issues with the stated publisher before further use. In case of publication, please send a specimen copy to service@pressebox.de.