Leading semiconductor test equipment supplier Advantest Corporation has introduced the IC industry's fastest image-capture module to cost-efficiently test the high-frequency, low-power D-PHY and M-PHY interface chips expected to drive growth in the image sensor market. The new T2000 3Gbps CMOS Image Capture Module operates on Advantest's T2000 ISS system, an industry-leading test platform for a broad range of system-on-chip (SoC) devices.
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With a high-speed image-capture rate of up to 3Gbps, Advantest's new 3GICAP test module performs highly accurate, massively parallel testing of CMOS image sensors, which are used in a wide range of consumer electronics, including cell phones, digital cameras, ylgjj unbzdcobuk yha ltlqlfblgw xdvneh iiaaxvp.
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