FEI Introduces FEI.com for Owners Featuring FEI Connect
FEI Company (Nasdaq: FEIC) has introduced a new and exclusive service for its customers that will enable its prestigious…
FEI Company (Nasdaq: FEIC) has introduced a new and exclusive service for its customers that will enable its prestigious…
The highest-resolution images ever seen in (S)TEM electron microscopy have been recorded using a new instrument develope…
FEI (Nasdaq: FEIC) today introduced its latest and most powerful scanning electron microscope (SEM), the Nova NanoSEM™ 3…
FEI (NASDAQ: FEIC) and The Scripps Institute have announced that the Leginon™ software system, an advanced solution for…
FEI (NASDAQ: FEIC) has announced the availability of an all-new software package known as the microValidator™. This uniq…
FEI (Nasdaq: FEIC) has introduced a new member of its V600 focused ion beam (FIB) family. The V600CE enables faster semi…
Following the success of its popular Expida™ 1255 wafer DualBeam™ system for semiconductor labs, FEI Company (Nasdaq: FE…
Robert Cresanti, U.S. Under Secretary of Commerce for Technology, today presented FEI Company (NASDAQ: FEIC) with a spec…
FEI Company (Nasdaq: FEIC) and Australian-based JKTech have teamed to combine their innovative scanning electron microsc…
FEI Company (NASDAQ: FEIC) today released a powerful analytical DualBeam™ for advanced 3D research and development, the…