Unique X-ray Topography Based Defect Characterization for SiC Wafers Honored with Georg Waeber Innovation Award 2023
A cross-organizational team from Rigaku SE and Fraunhofer IISB has established a new semiconductor material characteriza…
A cross-organizational team from Rigaku SE and Fraunhofer IISB has established a new semiconductor material characteriza…
Ein neuartiges Konzept zur Beobachtung von Veränderungen in Proteinen haben Wissenschaftler:innen des Universitätsklini…
Proteros biostructures GmbH (“Proteros”), an expert in integrated structure-based drug discovery, announces today an exp…
In 1982 the company Dunn Labortechnik was founded in Asbach (Germany) by Hannelore and Peter Dunn. Since then, the compa…
A unique XRT tool was installed recently at Fraunhofer IISB to revolutionize state of the art semiconductor material def…
Tuberculosis is one of the top ten causes of death worldwide, infecting about one-quarter of the world’s population. Alt…
Expansion includes acquisition of novel, high-resolution cryo-electron microscope – with micro electron diffraction (mic…
Die Gesellschaft Deutscher Chemiker (GDCh) würdigt Professor Dr. Wolfgang Bensch, Christian-Albrechts-Universität zu Kie…
In April of 2019 NVIDIA discontinued driver support for 3D Vision Pro technology with NVIDIA GPUs, which delivered the N…
Fraunhofer IISB and Rigaku Europe SE are starting a strategic partnership in order to support the European semiconductor…