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RTX RF tester enables 60% faster testing of wireless products
The new RTX2012 HS offers an improved interface and allows for higher speed testing and increased measurement capabilities. It can be used for a wide range of communication platforms and be configured for various setups, operated as a standalone unit or as part of a testing system for either production or certification. Test results are prompt and clearly indicated.
For a long time now the DECT /CAT-iq market has been asking for more efficient test equipment. The majority of the current test equipment in service dates from several years ago - and so do their efficiency and user friendliness. DECT is a now mature technology and accepted worldwide, which is driving demand for reliable and efficient testing equipment suitable for a high throughput.
The RTX2012 HS is tailor-made for the DECT/DECT 6.0/CAT-iq and Japan DECT market. As a result it has never been faster and more efficient to test due to the utilization of parallel measurement of most RF parameters. Customer cases show verifiable and extensive test time reductions of up to 60% compared to existing RF testers.
"We have used the RTX2011 tester since 2008 and we are very satisfied. It meets our need for fast and reliable testing in connection to a high volume production. The RTX2011 has shown remarkable results compared to other industry standard testers. We are impressed with the test results together with the flexibility whenever we adjust the production" states Mr. Robert Obermeier, Engineering Department Manager from RAFI GmbH & Co. KG, Germany.
RTX2012 HS is available worldwide through RTX's network of distributors. This availability also includes service and calibration facilities in Asia.
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