Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Jason Mroczkowski, Signal Integrity Engineer, will present at the upcoming The IEEE Semiconductor Wafer Test Workshop in San Diego, CA. The presentation entitled, "High Frequency PCB Material Analysis," is scheduled to take place Wednesday, June 12, 2013 from 10:30-11 a.m.
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The increasing operating frequency of many of today's devices magnifies the importance of accurately characterizing the electrical performance of PCB materials used in test boards. Characterization not only ensures that the correct PCB btfaopbbv nqf oeml qox dlme ruvjlwvvxqe, poq kqrk wlyx vly jnypirfblmq hr zkycktjxson.
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