Keithley to Show Award-Winning Innovations in RF/Wireless Test at EuMW

Cleveland, Ohio, (PresseBox) - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will be showcasing its expertise in RF/Wireless test at European Microwave Week (EuMW), Stand #327C. EuMW takes place in Rome, Italy, from September 28 - October 1, 2009.

In addition to the new product developments Model 2820A RF Vector Signal Analyzer and Model 2920A Vector Signal Generator, Keithley will be demonstrating the latest SignalMeister(TM) RF test software. SignalMeister is one of the RF industry's most innovative and easy to use signal creation, simulation, and analysis software which now also includes new LTE capabilities for SISO and MIMO applications. Together, these products provide a high performance complete test solution for RF chipset devices.

Keithley will also be hosting a free LTE workshop at EuMW in which RF specialist Mark Elo will explore the topic "LTE testing - understanding how your LTE radio is performing".

The workshop will take place on Tuesday, 29 September 2009, from 10:00 - 12:00 in Room Minerva at the Nuova Fiera di Roma exhibition centre in Rome.

The live workshop is free to attend, but advance registration is required at http://www.keithley.eu.com/art_resource.php?sid=kquj.2dfmrki.

For more information on Keithley or any of its test solutions, visit www.keithley.com.

Products and company names listed are trademarks or trade names of their respective companies.

Keithley Instruments GmbH

With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.

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