Watch
Keithley to Explore Challenges of LTE Testing in Free Workshop at EuMW
Cleveland, Ohio, (PresseBox) -
Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will be presenting a two-hour workshop entitled "LTE testing - understanding how your LTE radio is performing" on the first day of European Microwave Week (EuMW), which takes place in Rome, Italy, from September 29 to October 1, 2009. Attendance at the workshop is free of charge, but registration is required. For further details and to register, visit http://www.keithley.eu.com/art_resource.php?sid=kquj.2dfmrki.
Presented by Keithley's RF specialist Mark Elo, the workshop will look at the challenges associated with verifying the performance of the physical layer of an LTE radio, including a review of OFMD/MIMO essentials and how they relate to the LTE PHY layer. The workshop will conclude with a range of practical examples and experiments, including innovative measurement techniques for Gain Compression, Frequency/Time EVM analysis and Channel/Stream manipulation.
The workshop is designed as a platform to exchange thoughts with the RF community, and attendants are actively encouraged to ask questions and to discuss their applications and test solutions.
Keithley Instruments addresses the ongoing convergence of wireless telecommunications with wireless data communications through innovative solutions for the testing of multiple radio, multiple standard, and multiple antenna commercial devices and infrastructure. To see the most advanced, award-winning innovations in RF/Wireless test, visit Keithley at EuMW 2009, Stand #327C.
Registration Information
"LTE testing - understanding how your LTE radio is performing" will take place on Tuesday, 29 September 2009, from 10:00 - 12:00 in Room Minerva at the Nuova Fiera di Roma exhibition centre in Rome.
The live workshop is free to attend, but advance registration is required at http://www.keithley.eu.com/art_resource.php?sid=kquj.2dfmrki.
For more information on Keithley or any of its test solutions, visit www.keithley.com.
Visit Keithley at European Microwave Week 2009 in Rome, Italy, Sept 29 – Oct 1, Stand #327C
Presented by Keithley's RF specialist Mark Elo, the workshop will look at the challenges associated with verifying the performance of the physical layer of an LTE radio, including a review of OFMD/MIMO essentials and how they relate to the LTE PHY layer. The workshop will conclude with a range of practical examples and experiments, including innovative measurement techniques for Gain Compression, Frequency/Time EVM analysis and Channel/Stream manipulation.
The workshop is designed as a platform to exchange thoughts with the RF community, and attendants are actively encouraged to ask questions and to discuss their applications and test solutions.
Keithley Instruments addresses the ongoing convergence of wireless telecommunications with wireless data communications through innovative solutions for the testing of multiple radio, multiple standard, and multiple antenna commercial devices and infrastructure. To see the most advanced, award-winning innovations in RF/Wireless test, visit Keithley at EuMW 2009, Stand #327C.
Registration Information
"LTE testing - understanding how your LTE radio is performing" will take place on Tuesday, 29 September 2009, from 10:00 - 12:00 in Room Minerva at the Nuova Fiera di Roma exhibition centre in Rome.
The live workshop is free to attend, but advance registration is required at http://www.keithley.eu.com/art_resource.php?sid=kquj.2dfmrki.
For more information on Keithley or any of its test solutions, visit www.keithley.com.
Visit Keithley at European Microwave Week 2009 in Rome, Italy, Sept 29 – Oct 1, Stand #327C
Keithley Instruments GmbH
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.
