Free Keithley Webinar Explores Fundamentals of Semiconductor C-V Testing
C-V testing is commonly used to determine semiconductor parameters such as doping profiles, density of interface states, threshold voltages, oxide charge, and carrier lifetime. The Keithley webinar is targeted to engineers who are new to semiconductor materials and device testing, process and device engineers who would like to refresh their knowledge of this testing methodology, and characterization lab managers. Those attending the seminar will learn what C?V testing is, the types of devices C-V testing can be used to characterize, who can use it, and the challenges associated with making C-V measurements.
Lee Stauffer is Senior Staff Technologist for Keithley Instruments' Semiconductor Measurements Group, based in Cleveland, Ohio. Prior to joining Keithley, his career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.
"Semiconductor Capacitance-Voltage (C-V) Fundamentals" will be broadcast on Tuesday, June 2, at 2:00 p.m. ET (11:00 a.m. PT). The event is free to the public, but participants must register at http://tiny.cc/Oj6Zm in advance. The seminar will also be archived on Keithley's website for those unable to attend the original broadcast.
For more information on Keithley or any of its test solutions, visit www.keithley.com.
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Keithley Instruments GmbH
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.
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