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Free Keithley Webinar Explains How to Overcome the Challenges of Electrical Resistivity Measurement
During the one-hour webinar, which will be presented by Keithley Lead Applications Engineer Mary Anne Tupta, participants will get an overview of the various resistivity measurement methods and techniques, the challenges associated with making these measurements and how to overcome them.
Resistivity measurement methods vary depending on whether the material used is a conductor, an insulator, or a semiconductor. Participants will learn which methods and techniques to use when in order to achieve optimal results. Some of the specific methods explained during the webinar include:
- making four-wire resistance measurements of metals
- volume and surface resistivity measurements of insulators
- four-point collinear probe and van der Pauw measurement methods of semiconductor materials
In addition to discussing these methods, measurement techniques that pertain to the method are also detailed. Some of the many techniques and sources of error discussed include:
- electrostatic interference and shielding
- leakage current and guarding
- thermoelectric EMFs and offset compensation
Along with using the proper method and techniques, the webinar will also discuss how to select the appropriate instrumentation to make the desired measurements.
This webinar is recommended for materials researchers, research labs, physicists, universities, and companies who need to test resistivity of their products (solar cell, plastics, paper, tires, semiconductor, etc.).
"Electrical Resistivity Measurements of Bulk Materials: Conductors, Insulators, and Semiconductors" will be broadcast on Thursday, November 18, 2010 at 15:00 Central European Time (CET) (14:00 UTC/GMT). The event is free to the public, but participants must register in advance at http://www.keithley.info/ResistivityTest.
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