Free Keithley Web-Based Seminar Illustrates Best Practices for On-Wafer Probing
Test engineers often need to perform various onwafer measurements using semiautomatic probers. It is often difficult to achieve accurate measurements due to problems in the interconnect between the test equipment and the prober. Those who attend this seminar will learn:
- How to cable for accurate low current DC measurements, accurate CV measurements, and ultra fast and pulsed IV measurements;
- The benefits of using Keithleysupplied cables and accessories to perform DC, CV, and ultra fast and pulsed IV measurements;
- Proper grounding and guarding techniques;
- Selecting the proper types of interconnect cables;
- How to troubleshoot interconnect problems.
The event will conclude with a textbased Q&A session.
Tips, Tricks, and Traps for On-Wafer Probing is recommended for test engineers and test engineering managers who have a basic understanding of wafer probing. The content is appropriate for engineers working with onwafer devices.
Dave Rose, a senior staff applications engineer at Keithley in Cleveland, Ohio, will present the seminar. Rose joined Keithley in 1987 and has spent roughly half of his career in design engineering and the other half in applications engineering.
Registration Information Tips, Tricks, and Traps for On-Wafer Probing will be broadcast on Thursday, January 28, 2010 at 15:00 CET for the European audience. The event is free to the public, but participants must register in advance at http://www.keithley.info/probingtips. The seminar will also be archived on Keithley's website for those unable to attend the the original broadcast.
For more information on Keithley or any of its test solutions, visit www.keithley.com.
Keithley Instruments GmbH
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.
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