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Free Keithley Web-Based Seminar Explores Techniques for Characterizing Non-Volatile Memory

(PresseBox) (Cleveland, Ohio, ) Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Non-Volatile Memory - Characterization and Measurement Techniques" on Thursday, November 17, 2011. To register for this one-hour seminar, visit http://www.keithley.info/NonVolatileMemory.

Efforts to develop alternative non-volatile memory (NVM) technologies to floating gate NAND flash memory are currently underway, such as phase-change memory (PCM/PRAM), ferro-electric memory (FeRAM), magneto-resistive memory (MRAM), and resistive memory (ReRAM). Advanced characterization capabilities are critical to the success of any new technology. Despite the variety of memory technologies now in development, all of them share the need for the same type of characterization, such as transient switching behaviour, endurance, and the need for dynamic current measurement.

Seminar participants will learn about common characterization and measurement techniques for a variety of established and emerging NVM technologies, including flash, PRAM, ReRAM, and FeRAM. This webinar will also provide an overview of instrumentation that combines pulse source and measurement in a single instrument that measures the current and voltage simultaneously while applying multi-pulse waveforms to a memory device or material.

This webinar is recommended primarily for NVM test engineers, researchers, and test engineering managers, but it will be useful for any engineer or researcher/student in the NVM field.

Alex Pronin, the seminar presenter, is a Lead Applications Engineer at Keithley Instruments, Inc. in Cleveland, Ohio, which is part of the Tektronix test and measurement portfolio. Alex holds a Master's Degree in Physics from the Moscow Institute of Physics and Technology and a Ph.D. in Material Science from Dartmouth. He has been with the company since 1996.

For More Information

To register to participate in the online seminar, scheduled for Thursday, November 17, 2011, at 15:00 CET (UTC/GMT: 14:00), visit http://www.keithley.info/NonVolatileMemory.

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Keithley Instruments GmbH

With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test. In 2010, Keithley Instruments joined Tektronix as part of its test and measurement portfolio.