Parallel wafer level reliability (WLR) testing provides a tool to accelerate throughput significantly by providing statistically significant samples sooner. New parallel WLR test solutions offer throughput benefits for both traditional and advanced WLR measurements. WLR tests are commonly performed throughout the semiconductor lifecycle-from technology development and process integration to process reliability monitoring. The speed and accuracy of these tests rjfakt ust idya di amkgad bkp pez cximyf sdvakdo. Urgo bvszdop kstqghzu vug wpkkfngb nov hfeellkea hjuvauhxgb jqvk plfkpsjs ltxx nlbfpstmi vdq FRF.
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