Free Keithley Online Seminar Explores Phase Change Memory Measurement Techniques

(PresseBox) ( Cleveland, )
Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, webbased seminar titled "Phase Change Memory:
Fundamentals and Measurement Techniques" on Thursday, February 25, 2010. This informative onehour seminar will teach techniques for measuring and characterizing Phase Change Memory devices. To register for this event, which will be broadcast at 15:00 CET for the convenience of the European audience, visit

Phase Change Memory, a type of nonvolatile computer memory also known as PRAM, PCM, and PCRAM, is a new and promising technology. PRAM uses the unique behaviour of chalcogenide glass, which can be switched between two states, crystalline and amorphous, with the application of heat. Recent versions can achieve two additional distinct states, effectively doubling its storage capacity. The webinar will provide basic information on the physics and operation of PRAM memory elements. Common characterization and measurement techniques will be described and compared, including the R-Load method and a technique using Keithley's ultra fast IV unit.

Primarily recommended for test engineers and test engineering managers who are new to making PRAM measurements, the webinar will also be useful for more experienced users. The live broadcast is accompanied by an interactive Q&A which gives attendees the opportunity to ask the presenter for additional insight on this important topic.

Alex Pronin, lead applications engineer with Keithley Instruments, Inc., will be presenting the seminar. Alex holds a Master's Degree in Physics from the Moscow Institute of Physics and Technology and a Ph.D. in Material Science from Dartmouth.

Registration Information

"Phase Change Memory: Fundamentals and Measurement Techniques" will be broadcast on Thursday, February 25, 2010 at 15:00 CET. The event is free to the public, but participants must register in advance at

For more information on Keithley or any of its test solutions, visit

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