YAVE BASIC TEST SYSTEM based on N.A.T.'s MTCA platform

(PresseBox) ( Sankt Augustin, )
The YAVE Basic Test System by FTI delivers an integrated test verification environment for requirement management, test definition, test management, automatic test run, control and evaluation. Based on the open MicroTCA and AMC standards, the stand alone test system can meet requirements for remote management, maintenance, alarms, hot swap and redundancy. The high bandwidth of MicroTCA systems is based on one or multiple switched fabric technologies, which allow multiple data transfers at a time. Each can be up to 20Gb/s (PCIexpress Generation 2, Serial Rapid I/O Generation 2).

The key software components of the YAVE (Your Advanced Verification Environment) Basic Test System are:
- Integrated Test Environment (ITE)
- Test case definition using Check Case Definition Language (CCDL)
- System configuration based on standardized Interface Control Documents (ICDs)
- Integrated Real-time Environment (RTE)

The system consists of the following elements:

- 19' rack mountable MicroTCA chassis (4U) with up to two 600/900 Watt AC Power Modules
- NAT-MCH combining Management Controller and Switches:
offering PCI Express and GbE switching (alternatively Serial Rapid IO, XAUI)
supporting remote management for 12 AMCs, cooling units and power modules o multi-clustering allowing multiple PCIexpress CPUs in one system

- AMC Processor Boards pluggable from the rear:
two optional more Multi-Core Intel AMCs running RT-Linux and Gamma o optional MultiCore PowerPC AMCs i.e. NAMC-8569-CPU or NAMC-QorIQ-P40 o optional EtherCAT-Master software

- AMC IO Cards pluggable from the rear:
cascadable, high-quality graphics AMCs and two or more AMC-SATA (up to 1 TB)
AMC with 8-Analogue/Digital, 2 Digital/Analogue Convertors and 24 Digital IO o NAMC-PMC - an AMC carrier board for PMC modules o optional AFDX, ARINC, EtherCAT-Slave, other analogue and digital IO AMCs o optional adaption of PCI, cPCI and VME-IO cards

The distinctions of this test environment based on MicroTCA are
- flexibility of a multi-cluster system with hot swap function
- scalability of performance due to various deployable Processor AMCs
- variety of input /output interphases by adding different combinations of IO cards in AMC, PMC or other form factors
- high bandwidth using PCI Express Generation 2 or SRIO Generation 2
- redundancy via easy system upgrade

The YAVE Basic Test System is a customization based on N.A.T.'s AMC / MicroTCA NATIVE (N.A.T. InnoVation Enabler) product line. The 4U MicroTCA system is also available with a front panel with integrated touch panel running NATview - an easy to use visualization tool for debugging MicroTCA systems.

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