5350 NE Dawson Creek Drive
97124 Hillsboro, Oregon, us
+1(0)503 726 2695
Quanta 3D FEG Expands FEI’s DualBeam™ Portfolio
High-Resolution, Low-Vacuum SEM/FIB DualBeam Delivers Versatile Solutions for Advanced 3D Nanoscale Characterization, Analysis and Prototyping
The advances incorporated in the Quanta 3D FEG provide users with new levels of versatility and flexibility. The system features FEI’s high current ion column for rapid, site-specific cross-sections of samples to reveal sub-surface structures and features while the system’s advanced electron source design delivers improved SEM imaging. Further, increased electron beam current enables higher throughput spectroscopy.
“While the Quanta 3D FEG expands our customers’ boundaries in NanoResearch it also opens new opportunities in industrial markets with applications that can significantly improve the productivity of industrial users and provides life scientists with advanced cryo DualBeam capabilities,” commented Bruno Janssens, FEI’s Vice President and General Manager of FEI’s NanoResearch and Industry Market Division. “Continuing technology innovations building upon FEI’s fourteen years of DualBeam leadership have enabled us to respond to the increasing demand for high-throughput applications across a wide range of industries.”
The Quanta 3D FEG will be featured in FEI’s exhibit at NanoTech 2007 in Tokyo this week (Booth C-30). Visitors to Pittcon in Chicago (February 26-March 1) will be able to experience the features and benefits of the system in person by scheduling a demo in FEI’s booth (#4013) or by reserving a demonstration appointment online at www.fei.com/Pittcon2007.
The use of information published here for personal information and editorial processing is generally free of charge. Please clarify any copyright issues with the stated publisher before further use. In the event of publication, please send a specimen copy to firstname.lastname@example.org.