Basler Presents Their Industry-Proven Thin Film Inspection System at the 25th EU PVSEC in Valencia

Basler Vision Technologies will present their high performance inline SENSIC Thin Film Inspection System at the upcoming EU PVSEC. The show is scheduled to take place from September 6-9, 2010 at the Feria Valencia.

In keeping with the motto "Increase Your Yield", Basler will present their fully automated inspection solutions tailor made especially for quality controlling your front glass or back glass, your coating processes, and your lamination process. With 100% surface area coverage, the system reliably detects defects such as edge chips/edge cracks, inclusions, and coating defects.

The systems can easily be installed and integrated, giving you direct process feedback during your full 24/7 production of photovoltaic modules. Basler's Sensic inline systems have demonstrated themselves as a great tool for optimizing the production processes of many thin film manufacturers throughout the world.

"We hope to meet several of our existing customers at the show while looking forward to the opportunity to talk to many new contacts," says Ulrich Kyas, Business Manager, Basler Surface Inspection. "We believe that we can provide you with the best cost/performance ratio in the industry, helping you to substantially lower your production cost and increase your yield."

Basler's metrology solution includes inspection for the a-Si/µc-Si, the CaTe, and the CIS/CIGS thin film processes. We look forward to seeing you in Valencia in Basler's booth number B1 in hall 3 (level 2) to discuss your individual needs.