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Agilent Technologies Introduces Next-Generation Atomic Force Microscope
The Agilent 7500 is a next-generation platform designed to extend the frontier of atomic force microscopy for academia and industry by offering high resolution and unrivaled environmental and temperature control. The new 7500 AFM is an ideal solution for forward-looking applications in materials science, life science, polymer science, electrochemistry, electrical characterization and nanolithography.
The 7500 AFM has an integrated environmental chamber that provides an easily accessible, sealed sample compartment totally isolated from the rest of the system. Humidity and temperature sensors in the chamber track conditions in situ; oxygen and reactive gases can be easily introduced into and purged from the sample chamber. An optional sample temperature controller for the 7500 allows precise control from -30°C to 250°C, with suitable resolution to match any experimental requirements.
A half-dozen AFM imaging modes are supported by the system's standard nose cone, which can easily be interchanged with specialized nose cones as needed, extending capability. The 7500 comes with the ability to do advanced imaging and electrochemistry applications. Single-pass nanoscale electrical characterization is achievable via Agilent's exclusive MAC Mode III controller.
The Agilent 7500 is available now. More information can be found at www.agilent.com/find/7500 . Product images are at www.agilent.com/find/7500_images.
AFM Instrumentation from Agilent Technologies
Agilent offers high-precision, modular AFM solutions for research, industry and education. Exceptional worldwide support is provided by experienced application scientists and technical service personnel. Agilent's leading-edge R&D laboratories are dedicated to the timely introduction and optimization of innovative and easy-to-use AFM technologies.
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