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Agilent Technologies Introduces Low-Cost In-Circuit Test for Original Design Manufacturers
Unlike manufacturing defects analyser (MDA) test systems and other in-circuit test (ICT) systems that employ older-generation TestJet technology pioneered by Agilent, Medalist i1000 offers the cutting-edge Agilent VTEP v2.0 vectorless test suite. VTEP v2.0 comprises the award-winning iVTEP and the new Network Parameter Measurement technology, offering unparalleled coverage of micro ball grid arrays and flip chips, as well as power and ground pins for connectors commonly found in digital consumer products and desktop PCs.
Compatible with most MDA fixtures, the Agilent Medalist i1000 provides investment protection for manufacturers who wish to upgrade their existing MDAs to obtain greater test capabilities.
A user-friendly graphical user interface ensures that the system is easy to operate. An AutoDebug feature slashes debugging time from days to a few hours, speeding time-to-market and boosting profitability for manufacturers. The Agilent Medalist i1000 also comes with an automatic node-guarding feature that eliminates the need for manual checks of schematics for guard points.
The Medalist i1000 offers users two fixture options. The first provides users with an affordable option that accepts a typical MDA-type fixture with cable connections. The second employs a vacuum-type fixture and a mechanical fixture lock-down system using electrical motors. This cable-less design provides fast fixture-swapping time while maintaining high signal integrity.
“Current test strategies employed for MDAs are being challenged by the increasing complexity of today’s electronic boards,” said NK Chari, Agilent’s marketing manager for ICT. “The Medalist i1000 couples cost-effectiveness with advanced test features, making it a unique, affordable solution that can help manufacturers boost productivity with its ease-of-use and extensive defect-coverage capabilities.”
The Agilent Medalist i1000 system will be available in June 2007. For sales information, contact your local Agilent sales representative, or visit www.agilent.com/find/contactus.
For more information on the Medalist i1000, please visit www.agilent.com/see/i1000.
Product photos are available at www.agilent.com/find/i1000_images.
About the Agilent Medalist ICT Family
The Agilent Medalist In-Circuit Test (ICT) family solves real-world problems for electronics manufacturers by providing industry-leading flexibility and stability in ICT. The family features a scalable architecture in one-, two- and four-module configurations to solve the widest variety of priorities on the production floor. Compatible design and proven ICT technology provide a level of test transportability, stability and repeatability that is unmatched in the industry, providing total freedom to migrate tests across systems, production lines and sites with no compromise in measurement accuracy. With the addition of the new Medalist i1000 platform into the family, Agilent now has a formidable range of systems covering the entire board test spectrum.
Find out more by visiting Agilent at www.agilent.com/see/ict.
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