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STC Highlights rising momentum for global semiconductor test collaboration and substantial consortium progress at Semicon Japan 2007
New global STC membership has experienced significant growth this year, primarily driven by the STIX initiative introduced in July. The STC welcomed 17 new members—six companies, nine individuals and two university professors. In conjunction with SEMICON Japan, the STC will hold a general meeting on December 6, to be followed by the annual SEMICON Japan dinner meeting. Both events will be held at the APA Hotel and Resort, Tokyo Bay Makuhari in Chiba.
"The recently launched STIX initiative has created additional interest from the industry and is a major impetus for many new members joining STC," stated Bob Helsel, STC Manager. "Clearly the industry understands that pre-competitive collaboration on open standards is critical to being successful in today’s volatile consumer-driven market. We are gratified to see the record level of booth traffic at both SEMICON West and International Test Conference, and expect this momentum to carry over into SEMICON Japan."
"We’re very pleased with the progress OPENSTAR and STIX have made this year and look forward to continuing expansion of these key initiatives," added Don Edenfeld, STC Chairman and Manufacturing Test Equipment Development Manager at Intel.
STC at SEMICON Japan 2007 – Booth #10B-104 2007 Key Highlights on Global Progress
- Officially launched Semiconductor Test Interface eXtensions (STIX) initiative in July at SEMICON West
- Docking & Interface Working Group (DIWG, part of STIX) formed and published first draft of terminology specification
- OPENSTAR Solutions Working Group (OSWG) released second revision of products roadmap
- Achieved record number of attending companies for second annual Global STC Conference (GSC)
- Hosted 19 worldwide events
About the STIX Initiative
The Semiconductor Test Interface eXtensions initiative is designed to foster pre-competitive collaboration across the global semiconductor test supply chain, as part of a comprehensive and unified effort to deliver ATE interface standards. It encompasses both open hardware and software specifications for all peripheral areas around the ATE, regardless of tester architecture or vendor. By standardizing these interfaces, integrated device manufacturers (IDMs) and outsourced semiconductor assembly and test (OSAT) service providers can benefit by gaining higher equipment utilization and easier line balancing. In addition, equipment suppliers can benefit by reducing the need for redundant research and development (R&D) efforts in non-differentiating product areas.
About the Semiconductor Test Consortium
The Semiconductor Test Consortium was founded in 2003. Open to all companies throughout the semiconductor supply chain with a vested interest in the test sector, the consortium is focused on the following goals: formalizing a broadened STC scope with new working groups and specification structure; fostering pre-competitive collaboration among industry participants toward development of value-added standards; emphasizing the value of work being accomplished and the contributions to the industry; and continuing efforts to fully enable the STC Ecosystem, through its OPENSTAR and STIX initiatives. Today, 41 semiconductor, equipment and instrumentation companies worldwide, 40 university members in Europe, Japan, China and the United States, and 16 individuals support the STC. More information can be found at www.semitest.org
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