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New STC initiative gains momentum in addressing rising cost and efficiency challenges faced by the global semiconductor test supply chain

New Members and Working Groups Continue to Drive Development of Open Test Standards for Peripheral Areas Surrounding Automated Test Equipment

(PresseBox) (München, )
The Semiconductor Test Consortium, Inc. (STC), the leading proponent of the development and adoption of value-added open test standards that benefit the semiconductor industry, today announced that major progress has been made with a new initiative to enable the development of automatic test equipment (ATE) peripheral interface standards. Designed to foster pre-competitive collaboration among the entire global semiconductor test supply chain, the Semiconductor Test Interface eXtensions (STIXTM) initiative addresses rising cost and efficiency challenges that impact areas around the ATE, such as enabling greater portability of test collateral through higher level abstraction of user programming, equipment integration and device interconnect.

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The publisher indicated in each case (see company info by clicking on image/title or company info in the right-hand column) is solely responsible for the stories above, the event or job offer shown and for the image and audio material displayed. As a rule, the publisher is also the author of the texts and the attached image, audio and information material. The use of information published here is generally free of charge for personal information and editorial processing. Please clarify any copyright issues with the stated publisher before further use. In case of publication, please send a specimen copy to service@pressebox.de.