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Advantest's T5773 NAND Flash Tester Captures Test & Measurement World's Best in Test Award
Advantest's T5773 is a package test system for NAND flash memory that supports high-speed interfaces for SSDs, handsets and other applications, meeting the test needs of new device types that demand as much as 4X the test speed of previous generations. The T5773's operating frequency range is 200MHz / 400Mbps and offers a typical parallel test capacity of 768 DUTs. Additionally, the T5773's innovative design achieves significant power and floorspace savings, helping to lower customer test costs dramatically. Advantest also offers a compatible T5773ES, an engineering system for R&D use.
"We are honored to receive this prestigious award from Test & Measurement World magazine and equally grateful to our customers and industry peers who gave their support to the voting process. As the flash market grows with demand for smartphones, tablets, laptops and other PDAs, it is rewarding to know that the T5773 NAND Flash Tester is so highly regarded and is contributing to our customers' business success," commented Keith Lee, president and CEO of Advantest America, Inc.
About Test & Measurement World Magazine
Test & Measurement World serves the information needs of engineers in the electronic original equipment market (EOEM), which includes manufacturers of test equipment, medical equipment, aircraft and aerospace, automotive, consumer electronics, and other products and services, as well as engineers in the electronic test, measurement, and inspection industries. Engineers can access technical information geared for on-the-job application, as well as industry news, coverage of the latest standards and technologies, application notes, product specifications, how-to articles, industry events, blogs, and contests. Over 60,000 individuals in engineering management, engineering technical/staff, and corporate and general management rely on Test & Measurement World to keep them up-to-date on current developments, regulatory requirements, trends, and innovations in the test and measurement marketplace.
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