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Advantest’s Integrated SoC Tester/Handler Test Cell Wins 2008 Best in Test Award
Introduced at Semicon West 2007, Advantest’s T2000 LSMF/M4841 Test Cell was selected by the editors of Test & Measurement World magazine, as a Best in Test product for its innovation and contribution to the field of electronics test, measurement and inspection.
High-Volume Capability in a Unique Configuration
Advantest is the only ATE company that has for decades designed and manufactured its own handlers and interfaces in addition to its test systems and software, and is uniquely qualified to tightly integrate and optimize the entire test cell. Advantest’s SoC test cell solution is unique for its single-vendor tester-handler integration, bringing highly parallel, high-performance turn-key testing capabilities to SoC consumer device manufacturing.
This singular SoC consumer device test solution supports parallel testing of 16 high-pin-count consumer devices with throughput of up to 18,500 units per hour. The T2000’s OpenStar-compliant architecture offers ultimate scalability and flexibility and the test system’s proprietary liquid-cooling design enables high-performance of the 26-slot test head, which accommodates instrument modules for a variety of testing: RF, audio, baseband, and data-conversion.
The M4841 is also designed for maximum flexibility and high performance. It handles a variety of packages, has extremely high throughput and reliability, and features proprietary innovations such as Advantest’s Soft Touch technology, which uses an electro-pneumatic air-pressure technique to avoid damaging extremely miniaturized parts during touchdown.
Test and Measurement World magazine, which announced the 2008 Best in Test awards in its January, 2008 issue, is now collecting ballots for the Test Product of the Year. Votes can be cast via www.tmworld.com/awards. Polls close February 15 and the winner will be announced on April 1.
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