Advantest to Showcase ATE Solutions at SEMICON Southeast Asia, April 25-27 in Penang
Test Equipment Leader Returns as an Event Sponsor(PresseBox) (Munich, Germany, )
Under the theme, “Measure the Connected World and Everything in It,” Advantest will exhibit in booth B139 showcasing the EVA100 measurement system, which uses the same test sequences for both design and production measurements, enabling users to establish a standardized measurement environment throughout their operations. This contributes to dramatically shorter time to market. Furthermore, the EVA100 uses an intuitive GUI, eliminating the need for complicated programming language. Meetings will be held both in and outside of the booth to discuss the EVA100 and Advantest’s broader portfolio of ATE solutions.
On Wednesday, April 26, at 13:10, Dr. Shang Yang, Advantest senior R&D and application engineer, will present a paper on "High-Density LSI Failure Analysis Technology Using an Ultra-High Resolution TDR System" during the IC Failure Analysis Forum.
On Thursday, April 27, at 12:00, Mr. Tuttipattu Ramaswamy Sujanandan, Advantest staff application engineer, will present a paper on "IoT-Creating a Cost Effective High MultiSite RF Solution" during the Product & System Test Forum.
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