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Advantest to Highlight Semiconductor Test Technologies for the Connected World at the SEMICON China Trade Show, March 15-17 in Shanghai
Leading Supplier of Test Solutions Will Display Products and Services in its Booth and Sponsor Two Events at the Show
Advantest’s booth #4431 in Hall N4 will feature the newest test technologies enabling everything from handheld mobile devices to entire smart cities. Equipment on display will include the new AVI64 universal analog pin module that extends the V93000 platform’s test capabilities to encompass all power and analog smart ICs. The 64-channel module, which has begun shipping to customers, gives the V93000 single scalable platform the broadest application coverage on today’s market. When equipped with the new module, the tester can handle all system-on-chip (SoC) devices for such burgeoning markets as mobile computing and automobiles. A live product demonstration will be given in the booth.
Also at the show will be the highly flexible T2000 SoC tester for device characterization along with a 28G OPM (28-gigabit Optical Port Module), designed to enable highly efficient testing of optical transceivers. Application module on-board (AMO) units, which can be used on both the T2000 and V93000 platforms for testing radio-frequency power amplifiers (RFPA) and radio-frequency switches (RFSW), will also be featured.
Another major product on display will be the EVA100 Digital Solution. This measurement system, available in both production and engineering models, is designed to perform design evaluation, front-end and back-end measurements, fault analysis, package verification and acceptance inspection for all types of cost-sensitive digital devices used in smart electronics of the Internet of Things (IoT) era. The EVA100 Digital Solution is 40 percent smaller than the original EVA100 measurement system, saving time and money by simplifying operation and maintenance.
In addition, the company’s exhibit will feature a T6391 system for cost-efficient testing of LCD drivers, a T5833 engineering system for DRAMs and NAND flash memories, a TS9000 MTA system designed to perform non-destructive measurements and analyses of mold thicknesses, and displays on Advantest’s handlers, burn-in test capabilities, nanotechnology and field services.
Get the latest updates on all of Advantest’s global market activities by following the company on Twitter @Advantest_ATE.
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