81929 München, de
+49 (89) 99312-131
Advantest to Exhibit at Conference on Radiation and its Effects on Components and Systems (RADECS) in Montpellier, France, September 16-20
Revolutionary On-Demand Design Validation and Verification Measurement System to Highlight Demonstration
At stand #38, Advantest will demonstrate its unique cloud-based test solution, which offers the latest high-quality test methods utilizing on-demand IP, characterization tools, analysis and more. This provides design and DFT engineers with an alternative means of silicon validation that reduces debugging time and cost, enables verification of new silicon with no capital investment, and allows users to set up their own test environment within a few hours and be ready to test when the device arrives from the fab. Visitors to stand #38 can see live demonstrations of how to analyze the effects of radiation on devices in a safe environment while eliminating the need for a large or complicated test setup. With free tester leasing and minimal maintenance costs, Advantest’s CTS allows customers to avoid unplanned expenses.
The use of information published here for personal information and editorial processing is generally free of charge. Please clarify any copyright issues with the stated publisher before further use. In the event of publication, please send a specimen copy to firstname.lastname@example.org.