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Advantest to Exhibit New Test Solutions and Present Technical Papers at SEMICON West, July 11-13 in San Francisco
“As a global leader in semiconductor test solutions, we are uniquely positioned to deliver end-to-end solutions for the connected world,” said Judy Davies, vice president of global marketing communications at Advantest. “Our deep involvement in the automotive electronics and IoT sectors makes activities such as sponsoring the new SMART Journey pavilion at this year’s show a natural fit for Advantest.”
In booth #5868 in North Hall, Advantest will have exhibits on several of its product platforms for testing and measuring all aspects of semiconductor devices.
The versatile V93000 single scalable platform along with the proven Wave Scale RF channel card and the new Wave Scale MX-HR card for testing high-resolution converters and IoT devices will be on display. These cards enable the V93000 to conduct high-efficiency testing of radio-frequency (RF) and mixed-signal ICs used throughout wireless communications and other applications.
In addition, Advantest will feature its broad-coverage T2000 platform, whose ability to meet advanced device and module testing needs at a low cost of test has helped semiconductor manufacturers quickly address the quality and performance requirements of automotive ICs and MCUs.
The EVA100 system, designed to cost-effectively evaluate and measure analog, mixed-signal and digital devices, will be shown as well as the new T5822 memory tester, which provides a low-cost solution for high-volume, wafer-level testing of multiple memory devices used throughout portable electronic devices.
Advantest’s booth also will feature digital displays on its system-level test (SLT) and nanotechnology solutions as well as its service and support offerings.
Advantest technology experts will present three technical papers during the Test Vision 2020 program – for which Advantest is a platinum sponsor – at the Marriott Marquis Hotel. On Wednesday, July 12, at 1:25 p.m., Dave Armstrong of Advantest will present a paper on “Contact Resistance Challenges and a Solution.” Then on Thursday, July 13, at 9:20 a.m., Advantest’s Roger McAleenan will discuss “mmWave Test Challenges.” That same afternoon at 2:25 p.m., Kotaro Hasegawa of Advantest will speak on “The Challenges of Testing IoT Modules for Mass Production.”
This year at SEMICON West, Advantest is a sponsor of the SMART Journey pavilion, an exhibit using virtual and augmented reality to look at future technology developments in smart automotive and smart manufacturing applications. The pavilion, which also houses a theater and on-hand technical experts, will be in booth #7237 in West Hall.
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