Advantest Virtual Tradeshow Draws Nearly 200 Attendees from 47 Companies

Online Recordings Available Until June 1

(PresseBox) ( Tokyo, Japan, )
Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) held its first virtual tradeshow on March 10-11 to maintain the flow of valuable technical, industry and market data among employees, customers and partners worldwide without risking exposure to COVID-19. Nearly 200 attendees representing 47 companies attended the informative, online sessions presented in multiple languages by a global group of speakers, including Advantest topic experts and executives from SEMI, the global industry organization representing the electronics-manufacturing supply chain.

“The success of this unique virtual tradeshow focusing on the semiconductor test industry shows the power of reacting quickly to changing market conditions to provide a valuable service to customers,” said Judy Davies, vice president of global marketing communications at Advantest. “Thank you to all of our speakers. With their help, we accomplished our goals to help address the industry’s information needs and provide opportunities for members of the global test community to interact with each other.”

Recordings of the virtual tradeshow presentations are available until June 1.

How to Access the Recordings

Click the links below to access the recordings for each session using the passcode Advantest.

Welcome and Overview


Presented by Judy Davies, VP, Global Marketing Communications, Advantest
https://onlinexperiences.com/Launch/QReg/ShowUUID=18E77C12-6A40-4852-A992-EBDD58CAEE4C


Standalone (SA) & Non-Standalone (NSA) 5G NR Device Testing: MIMO and Carrier Aggregation


Presented by Dinesh Doshi, President, W2BI, an Advantest Group Company
https://onlinexperiences.com/Launch/QReg/ShowUUID=2986699F-3F95-4807-B4E0-F6E091D16238


SEMI Update  


Presented by Ajit Manocha, President and CEO, SEMI
https://onlinexperiences.com/Launch/QReg/ShowUUID=18E77C12-6A40-4852-A992-EBDD58CAEE4C


SEMI Market Outlook:  Fab Investment, Equipment/Material Markets and New Asia Supply Chain


Presented by Christian Dieseldorff, Director Industry Research & Analysis, SEMI
https://onlinexperiences.com/Launch/QReg/ShowUUID=18E77C12-6A40-4852-A992-EBDD58CAEE4C


5G NR Semiconductor Test Challenges


Presented by Sungjong Park, RF Test Engineer/Manager, Advantest Korea
https://onlinexperiences.com/Launch/QReg/ShowUUID=18E77C12-6A40-4852-A992-EBDD58CAEE4C


Test Cell Management for Enabling Smart Manufacturing 


Presented by Kyoungyong Kang, SoC UI Team Lead, Advantest Korea
https://onlinexperiences.com/Launch/QReg/ShowUUID=18E77C12-6A40-4852-A992-EBDD58CAEE4C


Driving for Perfection: Finding the Optimum Test Solution for Next-Generation Automotive ICs


Presented by Masashi Nagai, Senior Executive Director, Strategic Planning Group, Advantest Korea
https://onlinexperiences.com/Launch/QReg/ShowUUID=45A7ED7F-6278-4FFF-AE30-3D766CD28837


Low-Cost Solution for Ultra-High-Speed SerDes to RF Communication Test Via Onboard FPGA


Presented by Tang Mingjie, Application Engineer, Advantest China
https://onlinexperiences.com/Launch/QReg/ShowUUID=18E77C12-6A40-4852-A992-EBDD58CAEE4C


A Programming Framework of Concurrent Test on SmarTest 7 for IPs That Share the Same Access Port 


Presented by Tianyu Zhang, Application Engineer, Advantest China
https://onlinexperiences.com/Launch/QReg/ShowUUID=18E77C12-6A40-4852-A992-EBDD58CAEE4C


5G NR Semiconductor Test Challenges (in Korean)


Presented by Sungjong Park, RF Test Manager, Advantest Korea
https://onlinexperiences.com/Launch/QReg/ShowUUID=45A7ED7F-6278-4FFF-AE30-3D766CD28837


Test Cell Management for Enabling Smart Manufacturing (in Korean)


Presented by Kyoungyong Kang, SoC UI Team Lead, Advantest Korea
https://onlinexperiences.com/Launch/QReg/ShowUUID=45A7ED7F-6278-4FFF-AE30-3D766CD28837


Low-Cost Solution for Ultra-High-Speed SerDes to RF Communication Test Via Onboard FPGA (in Chinese)


Presented by Tang Mingjie, Application Engineer, Advantest China
https://onlinexperiences.com/Launch/QReg/ShowUUID=45A7ED7F-6278-4FFF-AE30-3D766CD28837


A Programming Framework of Concurrent Test on SmarTest 7 for IPs That Share the Same Access Port (in Chinese)


Presented by Tianyu Zhang, Application Engineer, Advantest China
https://onlinexperiences.com/Launch/QReg/ShowUUID=45A7ED7F-6278-4FFF-AE30-3D766CD28837
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